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Zheng, Xin; Zarcone, Ryan; Paiton, Dylan; Sohn, Joon; Wan, Weier; Olshausen, Bruno; Wong, H. -S. Philip . (2018). [IEEE 2018 IEEE International Electron Devices Meeting (IEDM) - San Francisco, CA, USA (2018.12.1-2018.12.5)] 2018 IEEE International Electron Devices Meeting (IEDM) - Error-Resilient Analog Image Storage and Compression with Analog-Valued RRAM Arrays: An Adaptive Joint Source-Channel Coding Approach. , (), 3.5.1–3.5.4. doi:10.1109/IEDM.2018.8614612 
An interview with Sci-Hub Founder Alexandra Elbakyan,Who exactly should pay for academic research